Techniques and Applications of Electron Probe Microanalysis
نویسندگان
چکیده
منابع مشابه
Electron probe microanalysis: principles and applications
This article summarizes the basic principles of electron probe microanalysis, with examples of applications in materials science and geology that illustrate the capabilities of the technique. Handbook of instrumental techniques from CCiTUB Electron probe microanalysis
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An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
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The section on tranquilizers comprises three chapters: (1) Phenothiazine derivatives by P. B. Bradley, (2) Rauwolfia derivatives by J. J. Lewis and (3) Diphenylmethane derivatives by T. R. Sherrod. The first two are, quite justifiably, restricted to detailed accounts of the pharmacology of chlorpromazine and reserpine respectively, which are treated as model compounds representative of their ch...
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The recognition and understanding of the role of the microstructure in controlling the macroscopic behavior of a material has been a major theme of science and technology throughout the history of NBS/NIST. In materials science, the late 19th century saw the development of the sample preparation procedures we know today as “metallography” and “materialography,” and the emergence of optical micr...
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EPMA has been applied to electron beam evaporated and r.f. sputtered layers of about 200 tig/cm. This includes analysis of trapped argon and oxygen ranging from 0.2 to 10 wt%. For primary electron energies of 5 to 15 keV depth range of X-ray emission may be predicted with an accuracy of ± 10 nm. Errors of quantitative analysis are discussed for various correction models and should not exceed 3....
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ژورنال
عنوان ژورنال: Journal of the Spectroscopical Society of Japan
سال: 1964
ISSN: 1884-6785,0038-7002
DOI: 10.5111/bunkou.13.7